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Patent data analytics for technology benchmarking: R-based implementation
World Patent Information Pub Date : 2020-03-01 , DOI: 10.1016/j.wpi.2020.101952
Ragini Jain , Mukul Tripathi , Vivek Agarwal , Jaya Murthy

Abstract We have utilized data analytics techniques to produce highly detailed, accurate, and actionable insights on patent data to enable the decision makers to take informed decisions. We have developed a unique method to help business professionals easily understand the patent landscape around a particular technology domain. The data inputs for the analyses are the patent statistics and the organization's technology priorities. We have used and implemented clustering algorithms on the patent data while considering the organization's technology priorities to identify solutions that can help organizations gain a competitive advantage, identify potential collaboration targets, technology-product alignment, business decision making, strategy planning and other strategic decisions.

中文翻译:

用于技术基准测试的专利数据分析:基于 R 的实现

摘要 我们利用数据分析技术对专利数据产生高度详细、准确和可操作的见解,使决策者能够做出明智的决定。我们开发了一种独特的方法来帮助商业专业人士轻松了解围绕特定技术领域的专利格局。分析的数据输入是专利统计数据和组织的技术优先级。我们在专利数据上使用并实施了聚类算法,同时考虑组织的技术优先级,以确定可以帮助组织获得竞争优势的解决方案,确定潜在的协作目标,技术产品对齐,业务决策,战略规划和其他战略决策。
更新日期:2020-03-01
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