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The WPI patent test collection
World Patent Information Pub Date : 2019-03-01 , DOI: 10.1016/j.wpi.2019.02.002
Mihai Lupu , Luca Papariello , Rosa Alentorn , Mike Baycroft , Jane List

Abstract To support the objectives of the journal, to publish new research and insights covering a broad spectrum of Intellectual Property information retrieval and patent analytics related practices and methods, the editors, together with the team at IFI CLAIMS® Patent Services, have put together a patent research collection, publicly available and for free, to foster scientific good practice: comparability, reproducibility, transparency and repeatability of experiments and results. The WPI collection is for this reason static. It will not be updated with new data. Otherwise, changes in experimental results would be impossible to trace with confidence to the new methods being proposed and not seen as a result of changes in the dataset. The WPI collection complements existing test collections, which are vertical (one domain or one authority over many years). Instead, the WPI collection is horizontal: it includes all technical domains from the major patenting authorities over the relatively short time span of two years.

中文翻译:

WPI专利测试集

摘要 为了支持该杂志的目标,发表涵盖广泛的知识产权信息检索和专利分析相关实践和方法的新研究和见解,编辑与 IFI CLAIMS® 专利服务团队一起制定了一份公开和免费的专利研究集,以促进科学的良好实践:实验和结果的可比性、再现性、透明度和可重复性。WPI 集合因此是静态的。它不会用新数据更新。否则,实验结果的变化将无法自信地追溯到提出的新方法,而不会被视为数据集变化的结果。WPI 集合补充了现有的测试集合,它们是垂直的(一个领域或一个权威多年)。相反,WPI 集合是横向的:它包括在两年相对较短的时间内来自主要专利机构的所有技术领域。
更新日期:2019-03-01
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