ABSTRACT

Two-dimensional layered materials/flakes, also known as crystalline atom-thick layer nanosheets, have recently been receiving great attention in electronics fabrication due to their unique and intriguing properties. The k-layer coverage area (i.e., the area covered by k number of overlapping layers) of the printed flake pattern significantly impacts on the properties of the printed electronics. In this work, we constructed a statistical model to describe the k-layer coverage of randomly distributed two-dimensional materials. A series of results are obtained to provide not only the expectation but also the variance of the coverage area. The boundary effects on the random flakes coverage are also studied. In addition, an approximated statistical testing approach is also developed in this work to detect abnormal coverage patterns. The case studies based on simulated data and real flakes images obtained from the inkjet printing process demonstrate the accuracy and effectiveness of the proposed model and analysis methods.

摘要

二维层状材料/薄片，也称为晶体原子厚层纳米片，由于其独特而有趣的特性，最近在电子制造中受到了极大的关注。印刷薄片图案的k层覆盖区域（即，由k个重叠层覆盖的区域）显着影响印刷电子器件的特性。在这项工作中，我们构建了一个统计模型来描述k- 随机分布的二维材料的层覆盖。获得了一系列结果，不仅可以提供期望，还可以提供覆盖区域的方差。还研究了随机薄片覆盖的边界效应。此外，在这项工作中还开发了一种近似统计测试方法来检测异常覆盖模式。基于模拟数据和从喷墨打印过程中获得的真实薄片图像的案例研究证明了所提出的模型和分析方法的准确性和有效性。