The use of pulsed mode scanning electron microscopy cathodoluminescence (CL) for both hyperspectral mapping and time-resolved measurements is found to be useful for the study of hybrid perovskite films, a class of ionic semiconductors that have been shown to be beam sensitive. A range of acquisition parameters is analysed, including beam current and beam mode (either continuous or pulsed operation), and their effect on the CL emission is discussed. Under optimized acquisition conditions, using a pulsed electron beam, the heterogeneity of the emission properties of hybrid perovskite films can be resolved via the acquisition of CL hyperspectral maps. These optimized parameters also enable the acquisition of time-resolved CL of polycrystalline films, showing significantly shorter lived charge carriers dynamics compared to the photoluminescence analogue, hinting at additional electron beam-specimen interactions to be further investigated. This work represents a promising step to investigate hybrid perovskite semiconductors at the nanoscale with CL.

发现使用脉冲模式扫描电子显微镜阴极发光 (CL) 进行高光谱映射和时间分辨测量可用于研究混合钙钛矿薄膜，这是一类已被证明对光束敏感的离子半导体。分析了一系列采集参数，包括束电流和束模式（连续或脉冲操作），并讨论了它们对 CL 发射的影响。在优化的采集条件下，使用脉冲电子束，可以通过采集 CL 高光谱图来解决混合钙钛矿薄膜发射特性的不均匀性。这些优化的参数还能够获得多晶薄膜的时间分辨 CL，显示与光致发光类似物相比寿命明显更短的电荷载流子动力学，暗示需要进一步研究额外的电子束-样品相互作用。这项工作代表了用 CL 研究纳米级混合钙钛矿半导体的有希望的一步。