We present detailed investigations of structural and static/dynamic magnetic properties of hydrogenated hcp-Co₈₀ ⁵⁷Fe₄Ir₁₆ soft magnetic thin films. Two different kinds of defects, i.e., destructive and non-destructive, were demonstrated by controlling the negative bias voltage of the hydrogenation process. Our results show that the structure and magnetic properties of our sample can be tuned by the density of the induced defects. These results provide better understanding of the hydrogenation effect and thus can be used in the future for materials processing to meet the requirements of different devices.

中文翻译：

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氢等离子体注入对hcp-Co80 57F​​e4Ir16薄膜微观结构和磁性的影响 国家自然科学基金项目（批准号11704167、11704317和11574122）。

我们详细研究了氢化 hcp-Co ₈₀ ⁵⁷ Fe ₄ Ir ₁₆软磁薄膜的结构和静态/动态磁性。通过控制加氢过程的负偏压，证明了两种不同类型的缺陷，即破坏性和非破坏性。我们的结果表明，我们的样品的结构和磁性可以通过诱导缺陷的密度来调整。这些结果提供了对加氢效应的更好理解，因此可以在未来用于材料加工以满足不同设备的要求。