Every year, leaf rust causes losses of wheat yield and quality all around the world. Breeding of cereals resistant to fungal diseases offers a long-term alternative for chemical protection and becomes increasingly important for organic farming and ecological food production. Accumulation of effective resistance genes in a single genotype requires recurrent enrichment of the wheat genepool with promising resistance alleles marked with DNA tags. Lr55 gene was transferred to KS04WGRC45 wheat from Elymus trachycaulus and provides effective resistance to leaf rust. Two F₂ mapping populations Bogatka × KS04WGRC45 (BK) and Nadobna × KS04WGRC45 (NK) were developed in order to identify the molecular marker(s) linked to the Lr55 gene. In total the segregations of 22 microsatellite and 7 DArT-based markers were used to create linkage groups corresponding to 1B chromosomes in individual mapping populations. At consensus map, Lr55 gene was flanked by XGwm374 and XWmc406 markers at distance of 8.3 and 14.8 cM, respectively. Until now, no molecular markers have been reported for Lr55 gene, and the molecular markers developed may be a starting point for the selection of plant materials for the presence of the Lr55 gene. However, additional marker systems based on next-generation sequencing may be necessary for more accurate location of Lr55 gene location.

每年，叶锈病都会导致全世界小麦产量和质量的损失。培育抗真菌病害的谷物为化学保护提供了一个长期的替代方案，对有机农业和生态食品生产变得越来越重要。在单个基因型中积累有效的抗性基因需要用 DNA 标签标记的有希望的抗性等位基因反复富集小麦基因库。Lr55基因被转移到来自Elymus trachycaulus 的KS04WGRC45 小麦中，并提供了有效的叶锈病抗性。开发了两个 F ₂作图群体 Bogatka × KS04WGRC45 (BK) 和 Nadobna × KS04WGRC45 (NK) 以鉴定与Lr55连锁的分子标记基因。总共使用了 22 个微卫星和 7 个基于 DArT 的标记的分离来创建对应于单个作图种群中 1B 染色体的连锁群。在共有图谱上，Lr55基因的两侧分别是XGwm374和XWmc406标记，距离分别为 8.3 和 14.8 cM。到目前为止，还没有关于Lr55基因的分子标记的报道，所开发的分子标记可能是选择植物材料是否存在Lr55基因的起点。然而，为了更准确地定位Lr55基因位置，可能需要基于下一代测序的额外标记系统。