当前位置: X-MOL 学术IEEE Trans. Device Mat Reliab. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Reliability Analysis of Storage Systems With Partially Repairable Devices
IEEE Transactions on Device and Materials Reliability ( IF 2 ) Pub Date : 2021-06-07 , DOI: 10.1109/tdmr.2021.3080775
Matthew Ring

For years, the IEEE International Integrated Reliability Workshop (IIRW) has been held at the edge of Fallen Leaf Lake in California, just south of Lake Tahoe. Typically, the conference is a four-day event comprised of lively discussions, beautiful vistas, and is an unparalleled informal event that is a fertile ground for the exchange of ideas and professional networking. For 2020 however, the conference was held virtually over a one-month period and was comprised of a blend of live video content and pre-recorded presentations.

中文翻译:

具有部分可修复设备的存储系统的可靠性分析

多年来,IEEE 国际综合可靠性研讨会 (IIRW) 一直在加利福尼亚州的落叶湖边缘举行,就在太浩湖以南。通常,会议为期四天,由热烈的讨论和美丽的景色组成,是一次无与伦比的非正式活动,是交流思想和专业网络的沃土。然而,对于 2020 年,该会议几乎在一个月的时间内举行,由现场视频内容和预先录制的演示文稿组成。
更新日期:2021-06-08
down
wechat
bug