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The fast multi-frame X-ray diffraction detector at the Dynamic Compression Sector
Journal of Synchrotron Radiation ( IF 2.5 ) Pub Date : 2021-06-02 , DOI: 10.1107/s1600577521003775
N W Sinclair 1 , S J Turneaure 2 , Y Wang 1 , K Zimmerman 2 , Y M Gupta 2
Affiliation  

A multi-frame, X-ray diffraction (XRD) detector system has been developed for use in time-resolved XRD measurements during single-event experiments at the Dynamic Compression Sector (DCS) at the Advanced Photon Source (APS). The system is capable of collecting four sequential XRD patterns separated by 153 ns, the period of the APS storage ring in the 24-bunch mode. This capability allows an examination of the temporal evolution of material dynamics in single-event experiments, such as plate impact experiments, explosive detonations, and split-Hopkinson pressure bar experiments. This system is available for all user experiments at the DCS. Here, the system description and measured performance parameters (detective quantum efficiency, spatial and temporal resolution, and dynamic range) are presented along with procedures for synchronization and image post-processing.

中文翻译:

动态压缩扇区的快速多帧 X 射线衍射探测器

已开发出多帧 X 射线衍射 (XRD) 检测器系统,用于在高级光子源 (APS) 的动态压缩扇区 (DCS) 进行单事件实验期间进行时间分辨 XRD 测量。该系统能够收集四个连续的 XRD 图案,间隔为 153 ns,即 24 束模式下 APS 存储环的周期。这种能力允许在单事件实验中检查材料动力学的时间演变,例如板撞击实验、爆炸爆炸和分裂霍普金森压力棒实验。该系统可用于 DCS 的所有用户实验。在这里,系统描述和测量的性能参数(探测量子效率、空间和时间分辨率、
更新日期:2021-07-24
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