An estimation method for complex index of refraction based on polarized reflection measurement under active illumination is presented. In this method the ratio of pBRDF (polarized Bidirectional Reflection Distribution Function) matrix elements f₁₀/f₁₁ given by active polarized reflection measurement is chosen as the new index for least squares approximation to estimate the complex index of refraction n and k of the illuminated materials, without the problem of inaccuracies and complexities in existing methods. Validation of this method is given by the measurement of two coating samples and two metal materials, which shows that this method can precisely estimate the complex index of refraction of the samples. The estimation error is decreased to less than 13% of the existing methods so that the estimation precision is significantly improved. We believe that this method will enable us to further characterize materials by polarization and accelerate the development of polarized detection and recognition.

提出了一种基于主动照明下偏振反射测量的复折射率估计方法。在该方法中，选择由主动偏振反射测量给出的 pBRDF（偏振双向反射分布函数）矩阵元素f ₁₀ / f ₁₁的比率作为最小二乘近似的新指数，以估计复数折射率n和k的照明材料，而没有现有方法的不准确和复杂性问题。通过对两种涂层样品和两种金属材料的测量验证了该方法的有效性，表明该方法可以精确估计样品的复折射率。估计误差降低到现有方法的13%以下，使得估计精度显着提高。我们相信这种方法将使我们能够通过极化进一步表征材料并加速极化检测和识别的发展。