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Scanning near-field infrared microscopy
Nature Reviews Physics ( IF 38.5 ) Pub Date : 2021-06-01 , DOI: 10.1038/s42254-021-00337-y
Tom Vincent

Tom Vincent explains how scanning near-field infrared microscopy can be combined with other techniques to probe nanomaterials.

中文翻译:

扫描近场红外显微镜

Tom Vincent 解释了扫描近场红外显微镜如何与其他技术相结合来探测纳米材料。
更新日期:2021-06-01
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