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EM/Power Side-Channel Attack: White-Box Modeling and Signature Attenuation Countermeasures
IEEE Design & Test ( IF 2 ) Pub Date : 2021-03-15 , DOI: 10.1109/mdat.2021.3065189 Debayan Das , Santosh Ghosh , Arijit Raychowdhury , Shreyas Sen
IEEE Design & Test ( IF 2 ) Pub Date : 2021-03-15 , DOI: 10.1109/mdat.2021.3065189 Debayan Das , Santosh Ghosh , Arijit Raychowdhury , Shreyas Sen
This article presents analysis methods to pin-point the cause of side channel leakage in integrated circuits and proposes a number of techniques for leakage attenuation.
中文翻译:
EM /电源侧信道攻击:白盒建模和签名衰减对策
本文提出了分析方法,以查明集成电路中侧通道泄漏的原因,并提出了许多用于泄漏衰减的技术。
更新日期:2021-03-15
中文翻译:
EM /电源侧信道攻击:白盒建模和签名衰减对策
本文提出了分析方法,以查明集成电路中侧通道泄漏的原因,并提出了许多用于泄漏衰减的技术。