Reliability-focused benchmarks are used to test systems in harsh operating conditions, including space and terrestrial radiation environment. The sensitivity to single-event effects of a microprocessor in a radiation environment depends on the set of input vectors used at the time of testing due to logical masking. This article analyzes the impact of the input test set on the cross section of the microprocessor and proposes a mechanism to derive a high-quality input test set using automatic test pattern generation (ATPG) for radiation testing of microprocessor’s arithmetic and logical units.

中文翻译：

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使用ATPG开发微控制器算术单元的辐射测试基准

注重可靠性的基准用于在恶劣的工作条件下测试系统，包括空间和地面辐射环境。在辐射环境中，微处理器对单事件影响的敏感性取决于逻辑掩蔽在测试时使用的输入矢量集。本文分析了输入测试集对微处理器横截面的影响，并提出了一种机制，该机制可以使用自动测试码型生成（ATPG）导出高质量的输入测试集，以对微处理器的算术和逻辑单元进行辐射测试。