Symmetry analysis of the Kikuchi pattern is helpful to determine the crystal structure, and can significantly reduce the screening range of phase identification, thereby improving the accuracy and reliability of phase identification in electron backscatter diffraction (EBSD). Accurately identifying the symmetry axis from the Kikuchi pattern is the primary task of symmetry analysis. In this study, a new method was proposed to identify symmetry axes in Kikuchi patterns with the aid of reciprocal vectors. Taking the Kikuchi patterns of single-crystal silicon as a typical example, a method for drawing reciprocal vectors after strict projection correction is introduced. The complex task of identifying the symmetry axis is transformed into an intuitive judgment of the geometric relationship between reciprocal vectors, thus greatly simplifying the process. This method successfully elucidated information on six Kikuchi poles in three single-crystal silicon Kikuchi patterns, including 3-fold axes, 4-fold axes and asymmetric axes. The method can also distinguish between a 3-fold axis and an analogous 3-fold axis despite their only slight differences.

中文翻译：

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通过倒易矢量识别菊池图案中的旋转对称轴

菊池图案的对称性分析有助于确定晶体结构，并且可以显着降低物相识别的筛选范围，从而提高电子背散射衍射（EBSD）中物相识别的准确性和可靠性。从菊池图案中准确识别对称轴是对称分析的首要任务。在这项研究中，提出了一种借助倒易矢量识别菊池图案中对称轴的新方法。以单晶硅的菊池图案为例，介绍了一种经过严格投影校正后绘制倒易矢量的方法。将识别对称轴的复杂任务转化为对倒数向量之间几何关系的直观判断，从而大大简化了流程。该方法成功地阐明了三个单晶硅菊池图案中六个菊池极的信息，包括三重轴、四重轴和不对称轴。该方法还可以区分 3 倍轴和类似的 3 倍轴，尽管它们只有细微的差别。