当前位置: X-MOL 学术Surf. Rev. Lett. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
CHARACTERIZATION OF ELECTRONIC STRUCTURES AT ORGANIC–2D MATERIALS INTERFACES WITH ADVANCED SYNCHROTRON-BASED SOFT X-RAY SPECTROSCOPY
Surface Review and Letters ( IF 1.1 ) Pub Date : 2021-04-28 , DOI: 10.1142/s0218625x21400096
LIANG CAO 1 , DONG-CHEN QI 2, 3
Affiliation  

The discovery of two-dimensional (2D) materials with single or a few-atom-thick layers has presented unprecedented opportunities to study, control and harness the properties of van der Waals (vdW) materials at their 2D limit. It also offers a platform that allows the arbitrary creation of heterostructures in a materials-by-design approach with properties tailored by the constituting components. Combining organic molecules with 2D materials to form hybrid heterointerfaces has recently emerged as a facile and versatile approach to engineer the electronic, optical, magnetic and chemical properties of 2D materials for new or optimized device applications. Underpinning the development of organic–2D materials heterostructures is the ability to interrogate the interfacial electronic structures and properties at multiple dimensions. This review provides a timely update on the application of synchrotron-based soft X-ray spectroscopies (SR-SXS) in the characterization of organic–2D materials interfaces. By harnessing the unparalleled high energy resolution, tunable energy, high brilliance and tunable polarization inherent to synchrotron radiation, electronic structures, charge transfer dynamics, molecular orientations and spin configurations at the hybrid interfaces can be examined, which helps us to formularize a coherent understanding of the organic–2D materials interfaces that will guide the design of new hybrid vdW structures and devices. We also offer our perspective on the future application of SR-SXS in the exploration of organic–2D materials heterostructures.

中文翻译:

使用先进的基于同步加速器的软 X 射线光谱仪对有机二维材料接口的电子结构进行表征

具有单个或几个原子厚层的二维 (2D) 材料的发现为研究、控制和利用范德华 (vdW) 材料在其二维极限下的特性提供了前所未有的机会。它还提供了一个平台,允许在按设计的材料方法中任意创建异质结构,并具有由组成组件定制的特性。将有机分子与二维材料结合以形成混合异质界面最近已成为一种简便且通用的方法,可用于设计二维材料的电子、光学、磁性和化学特性,以用于新的或优化的设备应用。有机-二维材料异质结构发展的基础是在多个维度上询问界面电子结构和性质的能力。本综述及时更新了基于同步加速器的软 X 射线光谱 (SR-SXS) 在有机-二维材料界面表征中的应用。通过利用同步辐射固有的无与伦比的高能量分辨率、可调谐能量、高亮度和可调谐极化,可以检查混合界面处的电子结构、电荷转移动力学、分子取向和自旋配置,这有助于我们对有机-二维材料界面将指导新的混合 vdW 结构和器件的设计。我们还就 SR-SXS 在探索有机二维材料异质结构中的未来应用提供了我们的观点。
更新日期:2021-04-28
down
wechat
bug