Electronic technologies that can operate in harsh radiation environments are important in space, nuclear and avionic applications. However, radiation-hardened (rad-hard) integrated circuits often require additional processing and more complex configurations than conventional systems. Here we review the development of low-power, rad-hard electronics, examining the underlying phenomena of radiation-induced electronic failure and the design methodologies available with conventional complementary metal–oxide–semiconductor (CMOS) technologies to mitigate the problem. We also explore the potential use and applications of various emerging memory technologies in rad-hard electronics.

可以在恶劣的辐射环境中运行的电子技术在太空，核和航空电子应用中很重要。但是，辐射硬化（rad-hard）集成电路通常需要比常规系统更多的处理和更复杂的配置。在这里，我们回顾了低功率，抗辐射电子设备的发展，研究了辐射诱发的电子故障的潜在现象以及传统的互补金属氧化物半导体（CMOS）技术可用来缓解该问题的设计方法。我们还将探讨各种新型存储技术在抗辐射电子产品中的潜在用途和应用。