Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Answers to fundamental questions in superresolution microscopy
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences ( IF 5 ) Pub Date : 2021-04-26 , DOI: 10.1098/rsta.2021.0105
Rainer Heintzmann 1, 2
Affiliation  

This article presents answers to the questions on superresolution and structured illumination microscopy (SIM) as raised in the editorial of this collection of articles (https://doi.org/10.1098/rsta.2020.0143). These answers are based on my personal views on superresolution in light microscopy, supported by reasoning. Discussed are the definition of superresolution, Abbe's resolution limit and the classification of superresolution methods into nonlinear-, prior knowledge- and near-field-based superresolution. A further focus is put on the capabilities and technical aspects of present and future SIM methods.

This article is part of the Theo Murphy meeting issue ‘Super-resolution structured illumination microscopy (part 1)’.



中文翻译:

超分辨率显微镜基本问题的答案

本文提供了在本系列文章 (https://doi.org/10.1098/rsta.2020.0143) 的社论中提出的有关超分辨率和结构化照明显微镜 (SIM) 的问题的答案。这些答案基于我个人对光学显微镜超分辨率的看法,并有推理支持。讨论了超分辨率的定义、阿贝分辨率极限以及超分辨率方法分为基于非线性、先验知识和基于近场的超分辨率。进一步关注当前和未来 SIM 方法的功能和技术方面。

本文是 Theo Murphy 会议问题“超分辨率结构照明显微镜(第 1 部分)”的一部分。

更新日期:2021-04-27
down
wechat
bug