A built-in self-test (BIST) system with a 72-dB carrier-to-noise ratio (C/N) and less than 1-ppm frequency tolerance of down-converted BIST tone for a multi-channel radar application is presented. The BIST consists of a frequency doubler, an up-conversion mixer (UPMIX), a variable gain amplifier, a phase shifter, an eight-way splitter, and an RF PAD coupler for BIST signal distribution. The proposed BIST system can operate from 76 to 81 GHz, mixing with arbitrary offset frequencies from 600 kHz to 42.7 MHz generated by a fully-synchronized phase locked loop (PLL). The proposed UPMIX can generate zero or non-zero offset frequencies by switching between two modes flexibly implemented in the same layout area. The measured relative phase among all eight channels was less than 2° from −25 °C to 150 °C through on-chip 12-bit analog-to-digital converters (ADCs). The proposed BIST was fabricated using a 40-nm CMOS process and assembled with a wafer-level chip-sized package (WLCSP). Also, state-of-the-art BIST beamformer analyses were demonstrated as one of the future methods for self-diagnosis with a null-depth monitoring for a multi-channel radar application.

中文翻译：

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具有72dB C / N和小于1ppm的频率容差的76至81GHz CMOS内置自测试，适用于多通道雷达应用

提出了一种内置自测（BIST）系统，该系统具有72dB的载波噪声比（C / N）和下变频BIST音调的小于1ppm频率容限，适用于多通道雷达应用。BIST由一个倍频器，一个上变频混频器（UPMIX），一个可变增益放大器，一个移相器，一个八路分离器和一个用于BIST信号分配的RF PAD耦合器组成。所提出的BIST系统可以在76至81 GHz的频率下工作，并与由完全同步锁相环（PLL）产生的600 kHz至42.7 MHz的任意偏移频率混合。所提出的UPMIX可以通过在相同布局区域中灵活实现的两种模式之间进行切换来生成零或非零偏移频率。通过片上12位模数转换器（ADC），从−25°C到150°C，所有八个通道之间测得的相对相位均小于2°。拟议的BIST使用40纳米CMOS工艺制造，并与晶圆级芯片尺寸封装（WLCSP）组装在一起。此外，最新的BIST波束形成器分析已被证明是未来的自诊断方法之一，可对多通道雷达应用进行零深度监视。