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Thin-film lithium niobate-on-insulator (LNOI) shear horizontal surface acoustic wave resonators
Journal of Micromechanics and Microengineering ( IF 2.3 ) Pub Date : 2021-04-20 , DOI: 10.1088/1361-6439/abf1b5
Tzu-Hsuan Hsu , Kuan-Ju Tseng , Ming-Huang Li

This work investigates the design methodology to obtain large electromechanical coupling factor ($k_{{\text{eff}}}^2$) and high quality factor (Q) of shear-horizontal surface acoustic wave (SH-SAW) resonators based on the thin-film lithium niobate-on-insulator (LNOI) technology. The guided SH wave can be excited through interdigital transducers and propagate at the very surface of the material stackings. Such a guided SH wave in LN/SiO2 double layer structure is expected to offer high $k_{{\text{eff}}}^2$ by confining the elastic strain energy in the piezoelectric thin film. To capture the optimum design window for high-performance LNOI SH-SAW devices, the impact of electrode material and its thickness on the $k_{{\text{eff}}}^2$ dispersive characteristics are intensively investigated by finite element method (FEM). In this study, various one-port resonators with wavelengths from 2.8 μm to 8 μm were fabricated on a LNOI wafer with LN and SiO2 thickness of 0.7 and 2 μm, respectively. The 100 nm thick gold film was chosen as the electrode of the devices, which demonstrate a similar $k_{{\text{eff}}}^2$ dispersive behavior to the FEM simulation with small discrepancy. Among the measurement results over several tested samples, a high-$k_{{\text{eff}}}^2$ of 25.5% and Q of 960 was recorded at a resonance frequency of 581 MHz (FOM = $k_{{\text{eff}}}^2 \cdot Q$ = 245), revealing great potential for the application of wide-band frequency selection in telecommunications.



中文翻译:

绝缘体上的薄膜铌酸锂 (LNOI) 剪切水平表面声波谐振器

这项工作研究了基于薄膜铌酸锂绝缘体 (LNOI) 技术获得大机电耦合因子 ( $k_{{\text{eff}}}^2$) 和高品质因子 ( Q ) 剪切水平表面声波 (SH-SAW) 谐振器的设计方法。 . 引导的 SH 波可以通过叉指式换能器激发并在材料堆叠的表面传播。LN/SiO 2双层结构中的这种引导SH波有望$k_{{\text{eff}}}^2$通过将弹性应变能限制在压电薄膜中来提供高。为了获得高性能 LNOI SH-SAW 器件的最佳设计窗口,电极材料及其厚度对$k_{{\text{eff}}}^2$通过有限元方法 (FEM) 对色散特性进行了深入研究。在这项研究中,与来自2.8的波长不同的单口谐振器μ m至8 μ m的制造成具有LN和SiO一个LNOI晶片上2的0.7和2厚度μ分别米。选择 100 nm 厚的金膜作为器件的电极,其表现出与$k_{{\text{eff}}}^2$FEM 模拟类似的色散行为,但差异很小。间在若干测试的样品,一个高的测量结果$k_{{\text{eff}}}^2$的25.5%和Q 960在581兆赫的共振频率被记录(FOM =$k_{{\text{eff}}}^2 \cdot Q$ = 245),揭示了宽带频率选择在电信中应用的巨大潜力。

更新日期:2021-04-20
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