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On the design of a reliable current reference for systems-on-chip
International Journal of Circuit Theory and Applications ( IF 2.3 ) Pub Date : 2021-04-21 , DOI: 10.1002/cta.2955
Rolando Torres 1 , Elkim Roa 1 , Luis E. Rueda G. 1
Affiliation  

Modern systems-on-chip use multiple current references to guarantee appropriate circuit biasing according to the required performance and power consumption. New reference topologies have emerged due to the necessity of ultra-low-power systems. Still, in the micro-Ampere domain, the most common architectures are preferred in industry-based applications, due to their reliability and accuracy. Motivated by the limited documentation and data associated with current references for SoCs, this work presents key observations in the design decisions, based on error contributions from the inherent elements of a reliable voltage-to-current reference architecture. Monte Carlo simulations show results for a 5 μA current reference, with inaccuracies at ±3σ of ±4% and ±1.3%, without and with trimming, respectively. Furthermore, two current references were fabricated using a 0.18 μm CMOS standard technology, in two different SoCs. Measurement results across voltage and temperature variations showed results for 50 μA ± 0.24% and 5 μA ± 0.8% current references without trimming.

中文翻译:

片上系统可靠电流基准的设计

现代片上系统使用多个电流参考,以根据所需的性能和功耗保证适当的电路偏置。由于超低功耗系统的必要性,出现了新的参考拓扑。尽管如此,在微安领域,最常见的架构在基于行业的应用中是首选,因为它们的可靠性和准确性。受与 SoC 电流参考相关的有限文档和数据的启发,这项工作基于可靠电压到电流参考架构的固有元素的误差贡献,提出了设计决策中的关键观察结果。Monte Carlo 模拟显示了 5 μA 电流参考的结果,±3 σ处的误差为 ±4 %和 ±1.3 %,分别没有和有修剪。此外,在两个不同的 SoC 中使用 0.18 μm CMOS 标准技术制造了两个电流基准。电压和温度变化范围内的测量结果显示了 50 μA ± 0.24 %和 5 μA ± 0.8 %电流基准的结果,无需微调。
更新日期:2021-04-21
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