Imaging the (sub)micron scale over large areas with high temporal resolution becomes increasingly necessary for the development and investigation of novel materials under realistic operation conditions. Small angle x-ray scattering imaging methods provide micro- and nanoscale structural information of materials. A fundamental shortcoming of such methods is the long acquisition time required to investigate macroscopic objects. In this work, we propose a single shot imaging method that allows reciprocal space sensitivity at a local level while maintaining spatial resolution for imaging macroscopic objects. We use an instrument that is sensitive to the ultrasmall angle x-ray scattering range and utilize it to image unstable polydisperse particle systems. This allows us to observe in real time the evolution of the local average particle diameter due to the stratification of the microparticles.

中文翻译：

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随时间变化的系统同时进行对等和真实空间X射线成像

为了在现实的操作条件下开发和研究新型材料，越来越需要在大面积上以高时间分辨率成像（亚）微米级。小角度X射线散射成像方法可提供材料的微米和纳米级结构信息。这种方法的根本缺点是研究宏观物体所需的采集时间长。在这项工作中，我们提出了一种单次成像的方法，该方法允许在局部级别上具有相互的空间敏感性，同时保持对宏观物体成像的空间分辨率。我们使用对超小角度X射线散射范围敏感的仪器，并使用它对不稳定的多分散粒子系统成像。