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Top-down, multi-scale numerical simulation of MEMS microphones under guided free fall tests
Microelectronics Reliability ( IF 1.6 ) Pub Date : 2021-04-23 , DOI: 10.1016/j.microrel.2021.114129
David Faraci , Aldo Ghisi , Silvia Adorno , Alberto Corigliano

Failures on MEMS microphones placed on dummy smartphone are observed during a guided free fall test. The instants before and after the first impact are registered with a high-speed camera and the displacement/velocity signals are used as input for three-dimensional finite element analyses at different scales to obtain insights at local level to judge whether possible ruptures arise. The numerical procedure follows a multi-scale, top-down approach and it can adopt both fluid-structure interaction and purely mechanical analyses. Finally, two loadings are transferred at the micro-scale to the thin silicon membrane representing the microphone: it is found that, in some drop cases, failures depend from the combination of the fluid-induced (air over-pressure) and of the solid-induced input (relative displacements at the anchors), and not from a single domain loading condition.



中文翻译:

在引导式自由落体测试下自上而下的MEMS麦克风的多尺度数值模拟

在引导式自由落体测试期间,会观察到放置在虚拟智能手机上的MEMS麦克风出现故障。用高速摄像机记录第一次撞击之前和之后的瞬间,并将位移/速度信号用作不同比例的三维有限元分析的输入,以获取本地的见解,以判断是否可能发生破裂。数值过程遵循多尺度,自上而下的方法,可以同时进行流固耦合和纯机械分析。最后,两个载荷在微观尺度上传递到代表麦克风的硅薄膜上:发现在某些跌落情况下,失效取决于流体引起的(空气超压)和固体的结合。引起的输入(锚点处的相对位移),

更新日期:2021-04-23
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