Although it has been suggested that infiltration of water vapor into multi-layer ceramic capacitors (MLCCs) can increase leakage current, few studies have reported how this increase is directly linked to the infiltration. In this work we performed accelerated temperature and humidity stress tests with heavy water as a tracer and investigated, using secondary ion mass spectrometry, whether traces of water vapor could be detected in MLCCs. In particular, deuterium was found in areas where an augmented leakage current was detected. It is clear that infiltration of water vapor into MLCCs increased the leakage current. This finding could lead to further improvements in MLCCs.

尽管有人认为水蒸气渗入多层陶瓷电容器 (MLCC) 会增加漏电流，但很少有研究报告这种增加与渗入直接相关。在这项工作中，我们使用重水作为示踪剂进行了加速温度和湿度压力测试，并使用二次离子质谱法研究了是否可以在 MLCC 中检测到痕量的水蒸气。特别是在检测到漏电流增加的区域中发现了氘。很明显，水蒸气渗入 MLCC 会增加漏电流。这一发现可能会导致 MLCC 的进一步改进。