Simple one-step synthesis of LiMn_0.5Ni_0.3Co_0.2O₂ thin film on Al-doped ZnO transparent current collector has been achieved and integrated on regular glass substrates using a pulsed laser deposition technique. The crystal structure, texture properties, film morphology, and electrochemical properties are compared before and after galvanostatic cycling process. The Al-doped ZnO current collector shows excellent stability after the cycling. Simple ellipsometry measurement coupled with AFM and SEM has been successfully applied to analyze the film failure mode in the half-cell. The successful integration of the cathode on glass substrates and the application of optical-based failure analysis provide an insightful approach for potential in operando analysis on solid-state batteries.

已经实现了在Al掺杂的ZnO透明集电器上简单地一步合成LiMn _0.5 Ni _0.3 Co _0.2 O ₂薄膜，并使用脉冲激光沉积技术将其集成在常规玻璃基板上。比较了恒电流循环过程之前和之后的晶体结构，织构性质，膜形态和电化学性质。铝掺杂的ZnO集电器在循环后显示出极好的稳定性。简单的椭偏测量与AFM和SEM结合已成功应用于分析半电池中的薄膜破坏模式。阴极在玻璃基板上的成功集成以及基于光学的故障分析的应用提供了一种有洞察力的潜在方法在固态电池的操作分析中。