当前位置: X-MOL 学术Russ. Phys. J. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Masking Circuit Faults and Trojan Circuit Injections Using Sat Solvers
Russian Physics Journal ( IF 0.6 ) Pub Date : 2021-04-10 , DOI: 10.1007/s11182-021-02287-5
A. Yu. Маtrosova , V. А. Provkin , V. Z. Tychinskiy , Е. А. Nikolaeva , G. G. Goshin

Combinational circuit C composed of gates and its sub-circuit with set V of output nodes and set U of input nodes are considered. The set V consists of output nodes of fault gates of the circuit C (only logical faults are examined) and fault free gates, the inputs of which are at the same time lines in that Trojan circuit payloads are injected. A procedure of forming the set U, as a rule, depends on circuit C fabrication technology and is out of our consideration. We suggest recovering the circuit C behavior by using as much as possible simple masking circuits (patch circuits). Masking circuit inputs are connected with nodes from the set U, and outputs are united either with nodes that are fed by nodes from the set V or directly with nodes from the set V. The conventional way of recovering the circuit C behavior (in the frame of Engineering Change Order (ECO) technologies) is based on using results of circuit C simulation. This way guarantees correct circuit C behavior only on a set of Boolean vectors applied during simulation. We suggest using incompletely specified Boolean functions of nodes from V in the frame of ECO technologies, which allows guaranteeing correct behavior of the circuit C among all its input Boolean vectors. Deriving the incompletely specified Boolean functions is connected with applying SAT solvers. Having got these functions, we then obtain the masking circuit (patch circuit) using ESPRESSO and ABC systems.



中文翻译:

使用Sat解算器掩盖电路故障和特洛伊木马程序注入

考虑由门组成的组合电路C及其子电路,其中输出节点的集合V和输入节点的集合U。集合V由电路C的故障门(仅检查逻辑故障)和无故障门的输出节点组成,无故障门的输入​​与注入Trojan电路有效负载的时间相同。通常,形成集合U的过程取决于电路C的制造技术,这不在我们的考虑范围之内。我们建议通过使用尽可能多的简单掩蔽电路(贴片电路)来恢复电路C的行为。屏蔽电路的输入与集合U中的节点相连,输出与集合V中的节点馈入的节点或直接与集合V中的节点馈入。恢复电路C行为的常规方法(在工程变更单(ECO)技术的框架内)基于使用电路C仿真的结果。这种方式仅在仿真期间应用的一组布尔向量上保证正确的电路C行为。我们建议在ECO技术的框架中使用来自V的节点的不完全指定的布尔函数,这可以保证电路C在其所有输入布尔向量中的正确行为。推导不完全指定的布尔函数与应用SAT求解器有关。获得了这些功能之后,我们便使用ESPRESSO和ABC系统获得了掩蔽电路(补片电路)。这种方式仅在仿真期间应用的一组布尔向量上保证正确的电路C行为。我们建议在ECO技术的框架中使用来自V的节点的不完全指定的布尔函数,这可以保证电路C在其所有输入布尔向量中的正确行为。推导不完全指定的布尔函数与应用SAT求解器有关。获得了这些功能之后,我们便使用ESPRESSO和ABC系统获得了掩蔽电路(补片电路)。这种方式仅在仿真期间应用的一组布尔向量上保证正确的电路C行为。我们建议在ECO技术的框架中使用来自V的节点的不完全指定的布尔函数,这可以保证电路C在其所有输入布尔向量中的正确行为。推导不完全指定的布尔函数与应用SAT求解器有关。获得了这些功能之后,我们便使用ESPRESSO和ABC系统获得了掩蔽电路(补片电路)。

更新日期:2021-04-11
down
wechat
bug