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GROWTH AND MAGNETIC PROPERTIES OF DC MAGNETRON SPUTTERED Co0.2Fe0.8 THIN FILM
Surface Review and Letters ( IF 1.1 ) Pub Date : 2021-04-07 , DOI: 10.1142/s0218625x21500530
MAHESWARI MOHANTA 1 , S. K. PARIDA 1 , ANANYA SAHOO 1 , V. R. R. MEDICHERLA 1
Affiliation  

We report the growth and characterization of the Co0.2Fe0.8 thin film. The thin film was deposited on Si (100) substrate by using a direct-current magnetron sputtering deposition technique. The Grazing Incidence X-ray Diffraction (GIXRD) analysis suggests a bcc crystal structure with a lattice constant of 2.87Å. The X-ray reflectivity (XRR) data analysis shows the thickness of the Co0.2Fe0.8 thin film is about 30 nm. The Energy Dispersive X-ray (EDAX) analysis shows the presence of 22.94% of Co and 77.06% of Fe in Co0.2Fe0.8 thin film. The Magneto-Optic Kerr Effect (MOKE) technique was used to investigate the magnetic properties and results support that Co0.2Fe0.8thin film exhibits soft magnetic character. The analysis of the M–H loop suggests that the value of the coercive field decreases with the increase of angle with respect to the magnetic easy axis. The MOKE measurement suggests that Co0.2Fe0.8 thin film alloy exhibits the least anisotropy with two-fold magnetic anisotropy. Magnetization reversibility was observed by using high-resolution Kerr microscopy. The domain images showed that reversibility occurs through nucleation and domain wall motion. Magnetic anisotropy dispersion was also observed which may be due to the misalignment of grains in the film due to which we got the least anisotropy. These properties of the prepared sample found potential application in the field of spintronics and magnetic sensors.

中文翻译:

直流磁控溅射Co0.2Fe0.8薄膜的生长和磁性

我们报告了公司0.20.8薄膜。通过使用直流磁控溅射沉积技术将薄膜沉积在Si(100)衬底上。掠入射 X 射线衍射 (GIXRD) 分析表明具有 2.87 晶格常数的体心立方晶体结构一种. X 射线反射率 (XRR) 数据分析显示了公司0.20.8薄膜约为 30 nm。能量色散 X 射线 (EDAX) 分析显示,22.94% 的 Co 和 77.06% 的 Fe 存在于公司0.20.8薄膜。磁光克尔效应 (MOKE) 技术用于研究磁性,结果支持公司0.20.8薄膜表现出软磁特性。对 M-H 环的分析表明,矫顽场的值随着相对于易磁轴角度的增加而减小。MOKE 测量表明公司0.20.8薄膜合金表现出最小的各向异性,具有两倍的磁各向异性。通过使用高分辨率克尔显微镜观察磁化可逆性。畴图像显示可逆性通过成核和畴壁运动发生。还观察到磁各向异性色散,这可能是由于薄膜中的晶粒未对准,因此我们得到的各向异性最小。制备的样品的这些特性在自旋电子学和磁传感器领域发现了潜在的应用。
更新日期:2021-04-07
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