The structure analysis of amorphous materials still leaves much room for improvement. Owing to the lack of translational or rotational symmetry of amorphous materials, it is important to develop a different approach from that used for crystals for the structure analysis of amorphous materials. Here, the angstrom-beam electron diffraction method was used to obtain the local structure information of amorphous materials at a sub-nanometre scale. In addition, we discussed the relationship between the global and local diffraction intensities of amorphous structures, and verified the effectiveness of the proposed method through basic diffraction simulations. Finally, some applications of the proposed method to structural and functional amorphous materials are summarised.

中文翻译：

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埃束电子衍射对非晶材料的局部结构分析

非晶材料的结构分析仍有很大的改进空间。由于非晶材料缺乏平移或旋转对称性，重要的是开发一种不同于晶体的方法用于非晶材料的结构分析。在这里，埃束电子衍射方法用于获得亚纳米级非晶材料的局部结构信息。此外，我们讨论了非晶结构的全局和局部衍射强度之间的关系，并通过基本衍射模拟验证了所提出方法的有效性。最后，总结了所提出的方法在结构和功能非晶材料中的一些应用。