A method is proposed for reconstructing the electron density profiles N(h) of the IRI model from ionograms of topside satellite sounding of the ionosphere. An ionograms feature is the presence of traces of signal reflection from the Earth's surface. The profile reconstruction is carried out in two stages. At the first stage, the N(h) –profile is calculated from the lower boundary of the ionosphere to the satellite height (total profile) by the method presented in this paper using the ionogram. In this case, the monotonic profile of the topside ionosphere is calculated by the classical method. The profile of the inner ionosphere is represented by analytical functions, the parameters of which are calculated by optimization methods using traces of signal reflection, both from the topside ionosphere and from the Earth. At the second stage, the profile calculated from the ionogram is used to obtain the key parameters: the height of the maximum hmF2 of the F2 layer, the critical frequency foF2, the values of B0 and B1, which determine the profile shape in the F region in the IRI model. The input of key parameters, time of observation, and coordinates of sounding into the IRI model allows obtaining the IRI-profile corrected to real experimental conditions. The results of using the data of the ISIS-2 satellite show that the profiles calculated from the ionograms and the IRI profiles corrected from them are close to each other in the inner ionosphere and can differ significantly in the topside ionosphere. This indicates the possibility of obtaining a profile in the inner ionosphere close to the real distribution, which can significantly expand the information database useful for the IRTAM (IRI Realmax Assimilative Modeling) model. The calculated profiles can be used independently for local ionospheric research.

提出了一种从电离层顶面卫星探测电离图重建IRI模型电子密度分布N（h）的方法。电离图的特征是存在来自地球表面的信号反射痕迹。轮廓重建分两个阶段进行。在第一阶段，通过本文使用电离图介绍的方法，从电离层的下边界到卫星高度（总剖面）计算出N（h）剖面。在这种情况下，顶侧电离层的单调分布是通过经典方法计算的。内部电离层的轮廓由解析函数表示，解析函数的参数是通过优化方法使用来自顶部电离层和地球的信号反射轨迹来计算的。在第二阶段 根据电离图计算出的轮廓用于获取关键参数：F2层的最大hmF2的高度，临界频率foF2，B0和B1的值，这些参数决定了IRI模型中F区域的轮廓形状。在IRI模型中输入关键参数，观察时间和探测坐标可以获取校正到实际实验条件的IRI曲线。使用ISIS-2卫星数据的结果表明，由电离图计算得到的剖面和由它们校正后的IRI剖面在内部电离层中彼此接近，并且在顶侧电离层中可能存在显着差异。这表明有可能在内部电离层中获得接近真实分布的轮廓，这可以大大扩展对IRTAM（IRI Realmax同化建模）模型有用的信息数据库。计算出的廓线可独立用于局部电离层研究。