TXRF spectrometry has been utilized for the determination of impurities in copper metal. Multielement standard solution has been used for the calibration of TXRF spectrometer. To avoid the matrix effects, Cu was separated by electrochemical separation method under optimized condition followed by determination of impurities using TXRF. K, Ca, Fe, Ni, and Zn are the impurities found to be present in copper metal. Bottom up approach was employed to get the measure of the combined uncertainty in the results. The uncertainty associated with the recovery of electrochemical separation process is the highest. The TXRF results were validated by analyzing the same sample using ICP-OES. Student's t-test was performed to establish the statistical indistinguishability of the results obtained from TXRF and ICP-OES.

中文翻译：

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基质分离后使用全反射 X 射线荧光光谱法测定铜金属中的杂质：方法验证和不确定性评估

TXRF 光谱法已用于测定铜金属中的杂质。多元素标准溶液已用于 TXRF 光谱仪的校准。为避免基质效应，在优化条件下通过电化学分离方法分离 Cu，然后使用 TXRF 测定杂质。K、Ca、Fe、Ni 和 Zn 是发现存在于铜金属中的杂质。采用自下而上的方法来衡量结果中的组合不确定性。与电化学分离过程回收相关的不确定性最高。TXRF 结果通过使用 ICP-OES 分析相同样品得到验证。进行学生t检验以建立从 TXRF 和 ICP-OES 获得的结果的统计不可区分性。