Ravishankar et al. claimed that drive-level capacitance profiling (DLCP) cannot resolve trap density in perovskites of given thickness. We point out that the trap densities derived by DLCP are from the differential capacitance at different frequencies; thus, the background charges caused by diffusion and geometry capacitance have been subtracted. Even for the nondifferential doping analysis, the contribution from diffusion capacitance is negligible and that from geometry capacitance is excluded.

中文翻译：

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对“解决金属卤化物钙钛矿太阳能电池中陷阱态的空间和能量分布”评论的回应

Ravishankar等。声称驱动级电容分析（DLCP）无法解决给定厚度的钙钛矿中的陷阱密度。我们指出，DLCP得出的陷阱密度来自不同频率下的差分电容。因此，已经减去了由扩散和几何电容引起的背景电荷。即使对于非微分掺杂分析，扩散电容的贡献也可以忽略不计，而几何电容的贡献被排除在外。