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TCAD-Based Flexible Fin Pitch Design for 3-nm Node 6T-SRAM Using Practical Source/Drain Patterning Scheme
IEEE Transactions on Electron Devices ( IF 3.1 ) Pub Date : 2021-01-29 , DOI: 10.1109/ted.2021.3053508
Junjong Lee , Jun-Sik Yoon , Seunghwan Lee , Jinsu Jeong , Rock-Hyun Baek

In this article, we analyzed the stability, power, performance, and area of 6T-SRAMs using a promising scaling booster, i.e., source/drain patterning (SDP) scheme for the 3-nm technology node based on 3-D TCAD simulation. SDP scheme allows to decrease the spacing between transistors by downsizing the source/drain epitaxy. Proposed 5-nm and 3-nm SDP-SRAM (SDP-SRAM 5 and SDP-SRAM 3 ) are compared with conventional 5-nm node SRAM (Conv-SRAM 5 ), quantitatively. Unlike a Conv-SRAM 5 , SDP-SRAMs have more design margins according to the two fin position parameters: fin location adjustment (FLA) and separation pitch adjustment (SPA). The optimized layout has the maximum FLA by significantly decreasing the back-end-of-line (BEOL) bitline and internal node capacitance. Read and write static noise margins were comparable (< 10 mV) between the SDP-SRAM and Conv-SRAM. The SDP-SRAM 5 improved the read access time 18% compared to the Conv-SRAM 5 in low-power (LP) applications, but the SDP-SRAM 3 degraded it by 11% in high-performance (HP) applications because of the narrow M2 pitch. Both the SDP-SRAM 5 and SDP-SRAM 3 improved write access time about 10% compared to a Conv-SRAM 5 in LP applications. The cell area of the SDP-SRAM 3 decreased about 0.64 times compared to a Conv-SRAM 5 without severe degradation of performance. The SDP scheme provides flexible layout designs enabling a high-density SRAM, promising for 3-nm node logic applications.

中文翻译:

基于TCAD的3nm节点6T-SRAM的灵活鳍间距设计,采用了实用的源极/漏极构图方案

在本文中,我们使用了有前途的缩放助推器(即基于3-D TCAD仿真的3纳米技术节点的源/漏图案(SDP)方案)来分析6T-SRAM的稳定性,功率,性能和面积。SDP方案允许通过缩小源极/漏极外延来减小晶体管之间的间距。将拟议的5纳米和3纳米SDP-SRAM(SDP-SRAM 5和SDP-SRAM 3 )与常规5纳米节点SRAM(Conv-SRAM 5 )进行定量比较。与Conv-SRAM 5不同 ,根据两个鳍位置参数,SDP-SRAM具有更多的设计余量:鳍位置调整(FLA)和间隔间距调整(SPA)。经过优化的布局可通过显着降低线路后端(BEOL)位线和内部节点电容来实现最大FLA。SDP-SRAM和Conv-SRAM之间的读写静态噪声容限相当(<10 mV)。与低功耗(LP)应用程序中的Conv-SRAM 5相比,SDP-SRAM 5的读取访问时间缩短了18%,但是在高性能(HP)应用中,SDP-SRAM 3的读取访问时间 降低了11%。窄的M2音调。与Conv-SRAM 5相比,SDP-SRAM 5和SDP-SRAM 3的写入访问时间均缩短了约10%。 在LP应用程序中。与Conv-SRAM 5相比,SDP-SRAM 3的单元面积 减少了约0.64倍,而 性能却没有严重下降。SDP方案提供了灵活的布局设计,可实现高密度SRAM,有望用于3纳米节点逻辑应用。
更新日期:2021-02-26
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