A type of W/Cr co-doped Bi₄Ti₃O₁₂ (ab. BTWC) ceramics were synthesized utilizing the traditional solid-state reaction process, and its thermal shock resistance (TSR) as well as the crack growth behavior was systematically investigated by water quenching technology. It can be found by the succeeded fractographic analysis that many edge thermal cracks began to appear in the samples subjected to thermal shock with ΔT ​= ​400 ​°C. According to an integrated TSR model, the critical thermal-shock temperature difference $\Delta T_C$was calculated to be 356 ​°C. Moreover, it can be noticed that the indenter induced crack growth behaviors under thermal shock loads presented three stages, i.e. no growth, large growth, and moderate growth, along with ΔT increasing from 0 ​°C to 700 ​°C. Finally, the asymmetry of P-E hysteresis loops was observed and understood by the orientated polarization of defect dipoles after the sample was thermally shocked, while the water-quenching process above the Curie temperature of the ceramics could lead to a random orientation of the defect dipoles. This research can not only evaluate the service conditions of Bi₄Ti₃O₁₂ high-temperature piezoceramics, but also understand the failure mechanism of bismuth layer structured ferroelectric ceramics in the case of thermal shock.

利用传统的固态反应工艺合成了一种W / Cr共掺杂的Bi ₄ Ti ₃ O ₁₂（ab。BTWC）陶瓷，并系统地研究了其耐热冲击性（TSR）以及裂纹扩展行为。通过水淬技术。通过成功的分形分析可以发现，在ΔT  = 400°C的热冲击下，样品中开始出现许多边缘热裂纹。根据集成的TSR模型，临界热冲击温差$\Delta {Ť}_C$经计算为356°C。此外，可以注意到压头在热冲击载荷下引起的裂纹扩展行为呈现三个阶段，即无增长，大增长和适度增长，以及ΔT从0°C升高到700°C。最后，通过热冲击样品后缺陷偶极子的定向极化来观察和理解PE磁滞回线的不对称性，而高于陶瓷居里温度的水淬过程可能导致缺陷偶极子的随机取向。该研究不仅可以评估Bi ₄ Ti ₃ O ₁₂的使用条件 高温压电陶瓷，但也了解铋层结构铁电陶瓷在热冲击情况下的失效机理。