A terahertz (THz) dielectric property characterization method based on a unified single oscillator model has been developed and applied to a variety of multi-component silicate oxide glasses. The experimental values of dielectric constant determined by THz time-domain spectroscopy (TDS) in the sub-THz region have been confirmed to agree well with the values calculated by the single oscillator model which incorporates the local field effects and the material’s ionicity. This has provided a unified formulation that enables systematic determination of the key physical parameters solely from the high-frequency (optical) and low-frequency (sub-THz) dielectric constants and characteristic resonance frequency in the (sub-)THz region. The low-frequency dielectric constant has been demonstrated to be fully determined by a single parameter of the microscopic total susceptibility. Also, the polarization ionicity, which is defined by the ionic fraction in the microscopic total susceptibility, has been found to be a good indicator to represent the ionic nature of the material. Through this analysis, an increasing trend of the effective ionic charge has been found in high-dielectric constant glasses such as oxyfluorosilicate glasses, and the physical mechanism of their dielectric constant enhancement has been discussed. The present method is expected to be applied to design and characterize dielectric properties of a wide range of multi-component glasses and other isotropic, insulating materials.

中文翻译：

---

使用统一振荡器模型系统表征多组分玻璃的太赫兹介电性能

已开发出基于统一单振荡器模型的太赫兹（THz）介电特性表征方法，并将其应用于多种多组分氧化硅玻璃。由THz时域光谱（TDS）确定的在亚THz范围内的介电常数实验值已被证实与包含本地场效应和材料的离子性的单振荡器模型所计算的值非常吻合。这提供了统一的公式，可以仅通过高频（光学）和低频（sub-THz）介电常数以及（sub-）THz范围内的特征谐振频率来系统地确定关键物理参数。已经证明，低频介电常数完全由微观总磁化率的单个参数确定。而且，已经发现由微观总磁化率中的离子分数所定义的极化离子性是表示材料的离子性质的良好指示剂。通过该分析，发现了在高介电常数玻璃如氧氟硅酸盐玻璃中有效离子电荷的增加趋势，并讨论了其介电常数提高的物理机理。期望将本方法应用于设计和表征多种多组分玻璃和其他各向同性的绝缘材料的介电性能。已经发现，由微观总磁化率中的离子分数所定义的R 2是代表材料的离子性质的良好指示剂。通过该分析，发现了在高介电常数玻璃如氧氟硅酸盐玻璃中有效离子电荷的增加趋势，并讨论了其介电常数提高的物理机理。期望将本方法应用于设计和表征多种多组分玻璃和其他各向同性的绝缘材料的介电性能。已经发现，由微观总磁化率中的离子分数所定义的R 2是代表材料的离子性质的良好指示剂。通过该分析，发现了在高介电常数玻璃如氧氟硅酸盐玻璃中有效离子电荷的增加趋势，并讨论了其介电常数提高的物理机理。期望将本方法应用于设计和表征多种多组分玻璃和其他各向同性的绝缘材料的介电性能。在高介电常数玻璃如氧氟硅酸盐玻璃中已经发现有效离子电荷的增长趋势，并且已经讨论了其介电常数提高的物理机理。期望将本方法应用于设计和表征多种多组分玻璃和其他各向同性的绝缘材料的介电性能。在高介电常数玻璃如氧氟硅酸盐玻璃中已经发现有效离子电荷的增长趋势，并且已经讨论了其介电常数提高的物理机理。期望将本方法应用于设计和表征多种多组分玻璃和其他各向同性的绝缘材料的介电性能。