PHELIX is a new beamline at National Synchrotron Radiation Centre SOLARIS in Kraków using soft X-rays. The source of radiation is an Elliptically Polarizing Undulator APPLE II type with permanent magnets producing a variable polarization of light. The maximum size of the excited area on the sample will be smaller than 100 µm × 100 µm with the resolving power (RP) of at least 10 000 over the entire energy range (available range 50–1500 eV) and for all polarizations. The PHELIX end-station enables a wide range of spectroscopic methods including angle integrated and angle resolved photoemission, spin resolved photoemission and x-ray absorption studies under UHV conditions. The VLEED spin detector allows to determine all three components of photoelectron spin. The beamline is perfectly suited for investigations of new electronic materials, topological insulators, thin films and multilayers systems, surface of bulk compounds, surface magnetism, spin polarized surface states, biomaterials, etc.

PHELIX是使用柔和X射线在克拉科夫国家同步辐射中心SOLARIS发射的新光束。辐射源是椭圆偏振波荡器APPLE II型，带有永久磁铁，产生可变的光偏振。样品上受激区域的最大尺寸将小于100 µm×100 µm，且分辨力（RP）至少为10 在整个能量范围（可用范围50–1500 eV）和所有极化下为000。PHELIX终端工作站支持多种光谱方法，包括超高压条件下的角度积分和角度分辨光发射，自旋分辨光发射和X射线吸收研究。VLEED自旋检测器可以确定光电子自旋的所有三个分量。该光束线非常适合用于研究新的电子材料，拓扑绝缘体，薄膜和多层系统，大块化合物的表面，表面磁性，自旋极化表面态，生物材料等。