CoO-NiO epitaxial bilayer system grown on MgO(001) substrate is investigated using x-ray magnetic linear dichroism (XMLD) spectroscopy with varying CoO overlayer thickness. An analysis of the Ni L ₂ edge XMLD spectra using anisotropic XMLD formulation within a two-domain model reveals that the Ni moments undergo a spin reorientation with increasing CoO thickness. Such a spin reorientation is attributed to the competing magnetic interactions at both the NiO film interfaces, suggesting the existence of a sharp horizontal domain wall separating the in-plane and out-of-plane NiO domains. Our study also demonstrates a possible way to investigate the spin-structure along the thickness within the same chemical structure using a model-based approach, in a noninvasive manner.

使用X射线磁线性二向色性（XMLD）光谱技术研究了Cog-NiO外延双层系统在MgO（001）衬底上生长的情况，该系统具有变化的CoO覆盖层厚度。在两个域模型中使用各向异性XMLD公式对Ni L ₂边缘XMLD光谱进行的分析显示，Ni矩会随着CoO厚度的增加而发生自旋重取向。这种自旋重新取向归因于两个NiO薄膜界面处的竞争性磁相互作用，这表明存在分离平面内和平面外NiO域的尖锐水平畴壁。我们的研究还证明了一种可能的方法，该方法使用基于模型的方法以无创方式研究沿着同一化学结构内厚度方向的自旋结构。