Abstract

The application of taint analysis to increase the efficiency of safety analysis of the software used by Internet-of-Things devices based on the ARM architecture is considered. A comparison of the existing dynamic instrumentation is made. As a result, we identified the most acceptable solution for the problem. The functionality of the selected tool has been refined in order to improve the efficiency of analyzing the influence of input data on the operation of the software under study.

中文翻译：

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污点分析在基于ARM架构的物联网设备软件安全性研究中的应用

摘要

考虑使用污点分析来提高基于ARM架构的物联网设备所使用软件的安全性分析效率。对现有动态仪器进行了比较。结果，我们确定了最可接受的解决方案。所选工具的功能已得到改进，以提高分析输入数据对所研究软件的操作影响的效率。