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Refraction characteristics of PbTiO3 film in THz range
Ferroelectrics ( IF 0.8 ) Pub Date : 2021-02-09 , DOI: 10.1080/00150193.2020.1853754
Zhichao Ma 1 , Chunya Luo 1 , Dan Li 1 , Yulan Wang 1
Affiliation  

Abstract

The refraction characteristics of 50 nm thickness of PbTiO3 (PTO) film pumped by various optical power in terahertz (THz) range is measured by THz time domain spectrum. Experiments indicated that the refraction index was 65–110 in the range of 0.2–1 THz and the tunability reached 36.95% when applied 400 mW optical field. The theoretical analysis revealed that the photorefractive and the photothermal effects is responsible for the refraction index monotonically varied with the optical pump power.



中文翻译:

太赫兹范围内PbTiO3薄膜的折射特性

摘要

通过太赫兹(THz)时域光谱测量了由太赫兹(THz)范围内的各种光功率泵浦的PbTiO 3(PTO)膜的50 nm厚度的折射特性。实验表明,在0.2-1 THz的范围内,折射率为65-110,在400 mW的光场下,可调谐性达到36.95%。理论分析表明,光折变和光热效应是导致折射率随光泵浦功率单调变化的原因。

更新日期:2021-02-10
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