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Charged particles and x-ray emission studies on a dense plasma focus device
Radiation Effects and Defects in Solids ( IF 1 ) Pub Date : 2021-02-03
S. R. Chung, R. A. Behbahani, C. Xiao

The emission of charged particles, electron and ion beams, and radiation, soft and hard x-rays, from the pinching plasma have been investigated in the UofS-I dense plasma focus (DPF) device. The UofS-I DPF is in a Mather-type configuration, powered by a 2 kJ, 25 kV-charged capacitor bank, operated with 10–20 mTorr argon gas. The charged particles have been recorded using a Faraday cup for ion beam collection, and a charge collector and a Rogowski coil for the electron beam measurement. Moreover, the soft and hard x-rays have been detected using a BPX-65, filtered silicon PIN photodiode and a scintillator, respectively. The time delays of signals with respect to the pinch time have been compared. Strong correlations of the charged particles and the x-ray emission intensities with the voltage peak and current dip have been observed, and consequently indicate their dependence on the anode voltage and strength of pinching of plasma.



中文翻译:

密集等离子体聚焦设备上的带电粒子和X射线发射研究

在UofS-1密集等离子体聚焦(DPF)设备中,已经研究了从收缩等离子体发射带电粒子,电子束和离子束以及辐射,软X射线和硬X射线。UofS-I DPF处于马瑟型配置,由2 kJ,25 kV充电的电容器组供电,以10–20 mTorr的氩气运行。已使用法拉第杯记录了带电粒子,以收集离子束,并使用电荷收集器和Rogowski线圈记录了电子束。此外,分别使用BPX-65,已过滤的硅PIN光电二极管和闪烁器检测了软X射线和硬X射线。已经比较了信号相对于收缩时间的时间延迟。观察到带电粒子和X射线发射强度与电压峰值和电流骤降之间存在很强的相关性,

更新日期:2021-02-03
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