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High-resolution inelastic x-ray scattering at the high energy density scientific instrument at the European X-Ray Free-Electron Laser
Review of Scientific Instruments ( IF 1.6 ) Pub Date : 2021-01-04 , DOI: 10.1063/5.0022886 L Wollenweber 1 , T R Preston 1 , A Descamps 2 , V Cerantola 1 , A Comley 3 , J H Eggert 4 , L B Fletcher 2 , G Geloni 1 , D O Gericke 5 , S H Glenzer 2 , S Göde 1 , J Hastings 2 , O S Humphries 6 , A Jenei 4 , O Karnbach 6 , Z Konopkova 1 , R Loetzsch 7 , B Marx-Glowna 7 , E E McBride 2 , D McGonegle 6 , G Monaco 8 , B K Ofori-Okai 2 , C A J Palmer 9 , C Plückthun 1 , R Redmer 10 , C Strohm 1 , I Thorpe 1 , T Tschentscher 1 , I Uschmann 7 , J S Wark 6 , T G White 11 , K Appel 1 , G Gregori 6 , U Zastrau 1
Review of Scientific Instruments ( IF 1.6 ) Pub Date : 2021-01-04 , DOI: 10.1063/5.0022886 L Wollenweber 1 , T R Preston 1 , A Descamps 2 , V Cerantola 1 , A Comley 3 , J H Eggert 4 , L B Fletcher 2 , G Geloni 1 , D O Gericke 5 , S H Glenzer 2 , S Göde 1 , J Hastings 2 , O S Humphries 6 , A Jenei 4 , O Karnbach 6 , Z Konopkova 1 , R Loetzsch 7 , B Marx-Glowna 7 , E E McBride 2 , D McGonegle 6 , G Monaco 8 , B K Ofori-Okai 2 , C A J Palmer 9 , C Plückthun 1 , R Redmer 10 , C Strohm 1 , I Thorpe 1 , T Tschentscher 1 , I Uschmann 7 , J S Wark 6 , T G White 11 , K Appel 1 , G Gregori 6 , U Zastrau 1
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We introduce a setup to measure high-resolution inelastic x-ray scattering at the High Energy Density scientific instrument at the European X-Ray Free-Electron Laser (XFEL). The setup uses the Si (533) reflection in a channel-cut monochromator and three spherical diced analyzer crystals in near-backscattering geometry to reach a high spectral resolution. An energy resolution of 44 meV is demonstrated for the experimental setup, close to the theoretically achievable minimum resolution. The analyzer crystals and detector are mounted on a curved-rail system, allowing quick and reliable changes in scattering angle without breaking vacuum. The entire setup is designed for operation at 10 Hz, the same repetition rate as the high-power lasers available at the instrument and the fundamental repetition rate of the European XFEL. Among other measurements, it is envisioned that this setup will allow studies of the dynamics of highly transient laser generated states of matter.
中文翻译：
欧洲 X 射线自由电子激光器的高能量密度科学仪器上的高分辨率非弹性 X 射线散射
我们介绍了一种装置，用于在欧洲 X 射线自由电子激光器 (XFEL) 的高能量密度科学仪器上测量高分辨率非弹性 X 射线散射。该设置使用通道切割单色器中的 Si (533) 反射和近后向散射几何结构中的三个球形切割分析器晶体，以达到高光谱分辨率。实验装置的能量分辨率为 44 meV，接近理论上可实现的最小分辨率。分析器晶体和检测器安装在弯曲导轨系统上，可在不破坏真空的情况下快速可靠地改变散射角。整个装置设计为以 10 Hz 的频率运行，与仪器上可用的高功率激光器相同的重复频率和欧洲 XFEL 的基本重复频率。在其他测量中，
更新日期：2021-01-29
中文翻译：
欧洲 X 射线自由电子激光器的高能量密度科学仪器上的高分辨率非弹性 X 射线散射
我们介绍了一种装置，用于在欧洲 X 射线自由电子激光器 (XFEL) 的高能量密度科学仪器上测量高分辨率非弹性 X 射线散射。该设置使用通道切割单色器中的 Si (533) 反射和近后向散射几何结构中的三个球形切割分析器晶体，以达到高光谱分辨率。实验装置的能量分辨率为 44 meV，接近理论上可实现的最小分辨率。分析器晶体和检测器安装在弯曲导轨系统上，可在不破坏真空的情况下快速可靠地改变散射角。整个装置设计为以 10 Hz 的频率运行，与仪器上可用的高功率激光器相同的重复频率和欧洲 XFEL 的基本重复频率。在其他测量中，
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