Chips from credit cards issued by the major US banks have been tested with optically stimulated luminescence (OSL) as potential materials for use in emergency radiation dosimetry. The following dosimetric properties have been studied: (1) OSL decay curves from both irradiated and unirradiated samples; (2) dose-response characteristics of the OSL and values of minimum detectable doses; (3) fading of the OSL signal with time after irradiation. No OSL was detected in unexposed samples while prominent signals were observed after irradiation. It was found that the shape of the OSL signals can be fitted by a combination of an exponentially decaying function and a power function. The dose-response relationship was linear in the range 0–7 Gy if the OSL signals were measured at the same effective time after irradiation and normalized to the response to a test dose. Dose recovery tests demonstrated that the doses can be reconstructed with an accuracy ±20% if the OSL measurements are conducted within 7 days after exposure and the corresponding OSL doses are corrected for fading.

美国主要银行发行的信用卡中的芯片已经过光学刺激发光（OSL）测试，可作为应急辐射剂量测定中的潜在材料。研究了以下剂量学性质：（1）辐照和未辐照样品的OSL衰减曲线；（2）OSL的剂量反应特性和最小可检测剂量值；（3）照射后，OSL信号随时间而衰减。在未曝光的样品中未检测到OSL，而在辐照后观察到明显的信号。已经发现OSL信号的形状可以通过指数衰减函数和幂函数的组合来拟合。如果在照射后的同一有效时间测量OSL信号并将其归一化为对测试剂量的响应，则剂量-响应关系在0-7 Gy范围内呈线性关系。剂量恢复测试表明，如果在暴露后7天内进行OSL测量并且校正了相应的OSL剂量以褪色，则可以以±20％的精度重建剂量。