In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.

中文翻译：

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波导的成像结

在本文中，我们解决了在线性波导中通过结点相互关联的线性采样方法中的缺陷识别问题。首先，考虑以特性突然变化为特征的波导，其次，更复杂的情况是多个半波导通过复杂几何形状的结点相互关联。一些二维数值实验说明了我们的方法。