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High signal-to-noise ratio differential conductance spectroscopy
Journal of Vacuum Science & Technology B ( IF 1.4 ) Pub Date : 2021-01-22 , DOI: 10.1116/6.0000823
Hamed Alemansour 1 , S. O. Reza Moheimani 1 , James H. G. Owen 2 , John N. Randall 2 , Ehud Fuchs 2
Affiliation  

The scanning tunneling microscope (STM) has enabled manipulation and interrogation of surfaces with atomic-scale resolution. Electronic information about a surface is obtained by combining the imaging capability of the STM with scanning tunneling spectroscopy, i.e., measurement of current-voltage (I/V) characteristics of the surface. We propose a change in the STM feedback loop that enables capturing a higher quality dI/dV image. A high frequency dither voltage is added to the bias voltage of the sample, and the fundamental frequency component of the resulting current is demodulated. The in-phase component of this signal is then plotted along with the X and Y position data, constructing the dI/dV image. We show that by incorporating notch filters in the STM feedback loop, we may utilize a high-amplitude dither voltage to significantly improve the quality of the obtained dI/dV image.

中文翻译:

高信噪比差分电导光谱

扫描隧道显微镜(STM)能够以原子级分辨率对表面进行操纵和询问。通过将STM的成像能力与扫描隧道光谱法(即表面的电流-电压(I / V)特性的测量)相结合,可以获得有关表面的电子信息。我们建议对STM反馈回路进行更改,以捕获更高质量的dI / dV图像。将高频抖动电压添加到样本的偏置电压,并对所得电流的基频分量进行解调。然后将该信号的同相分量与X和Y位置数据一起绘制,以构建dI / dV图像。我们展示了通过将陷波滤波器纳入STM反馈环路,
更新日期:2021-01-22
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