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Super-resolution imaging for sub-IR frequencies based on total internal reflection
Optica ( IF 10.4 ) Pub Date : 2021-01-19 , DOI: 10.1364/optica.408678
Lauren E. Barr , Peter Karlsen , Samuel M. Hornett , Ian R. Hooper , Michal Mrnka , Christopher R. Lawrence , David B. Phillips , Euan Hendry

For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate a near-field imaging approach that enables subwavelength lateral resolution in images with contrast dependent on optical thickness. We illuminate a sample in a total internal reflection geometry, with a photoactivated spatial modulator in the near field, which allows optical thickness images to be computationally reconstructed in a few seconds. We demonstrate our approach at 140 GHz (wavelength 2.15 mm), where images are normally severely limited in spatial resolution, and demonstrate mapping of optical thickness variation in inhomogeneous biological tissues.

中文翻译:

基于全内反射的亚红外频率超分辨率成像

对于旨在精确确定层厚度的测量,由于聚焦光束所需的角射线分布,因此在光学厚度的灵敏度和横向分辨率之间存在自然的折衷。我们演示了一种近场成像方法,该方法可以在图像中实现亚波长横向分辨率,而对比度取决于光学厚度。我们以全内反射几何形状照射样品,并在近场中使用光激活的空间调制器,从而可以在几秒钟内通过计算重建光学厚度图像。我们演示了我们在140 GHz(波长2.15 mm)下的方法,该方法通常在空间分辨率上严重限制图像,并演示了非均匀生物组织中光学厚度变化的映射。
更新日期:2021-01-21
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