Quantum-dot cellular automata (QCA) are a new technology used to fabricate digital circuits on the nanoscale in place of CMOS technology, which has limitations in device density. QCA devices are low in power consumption and high in speed due to their structure. Although some defects may occur during chemical fabrication, QCA gates and circuits can be designed to be fault-tolerant. The majority gate is most often used in QCA circuits; thus, many papers have investigated different structures for it and tried to design a fault-tolerant gate against only one defect. We have proposed a new structure for a three-input majority gate with a good percentage of truth output despite the multiple defects that may take place concurrently. A full adder is then designed using the proposed majority gate to demonstrate the degree of fault tolerance of QCA circuits made of fault-tolerant gates.

量子点自动机（QCA）是一种用于在纳米级上制造数字电路的新技术，代替了CMOS技术，该技术在设备密度方面存在局限性。QCA设备由于其结构而功耗低，速度快。尽管在化学制造过程中可能会发生一些缺陷，但是QCA栅极和电路可以设计为容错的。多数门最常用于QCA电路中。因此，许多论文为此研究了不同的结构，并尝试设计仅针对一个缺陷的容错门。我们为三输入多数门提出了一种新结构，尽管可能同时发生多个缺陷，但具有很高的真输出百分比。