Various sample preparation methods have been proposed for X-ray fluorescence analysis of mineral components in a liquid. Among them, the dry spot method is widely used; however, the issue is that the prepared dried residue is non-uniform. We developed nanoimprint films using the thermal nanoimprint method. A uniform and thin dry residue was prepared using the nanoimprint film. The thin film fundamental parameter method, a quantitative analysis method used in X-ray fluorescence analysis, was applied to dried residues to analyze their content. As a result, the analysis value was found to be close to the authentication and inductively coupled plasma atomic emission spectromy analysis values.

已经提出了各种样品制备方法用于液体中矿物成分的X射线荧光分析。其中，干斑法被广泛使用。然而，问题在于所制备的干燥残留物不均匀。我们使用热纳米压印方法开发了纳米压印膜。使用纳米压印膜制备均匀且稀薄的干燥残留物。将薄膜基本参数法（一种用于X射线荧光分析的定量分析方法）应用于干燥残留物以分析其含量。结果，发现分析值接近认证和电感耦合等离子体原子发射光谱分析值。