Non-covalent functionalization of layered 2D materials is an essential tool to modify and fully harness their optical, electrical, and chemical properties. Herein, a facile method enabling the selective formation of self-assembled monolayers (SAMs) of perylene bisimide (PBI) on transition metal dichalcogenides (TMDs), directly on the growth substrate (on-chip), is presented. Laterally-resolved infrared atomic force microscopy (AFM-IR) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) are applied as superior techniques to gain detailed information beyond traditional surface analysis techniques, such as Raman spectroscopy and AFM, on TMD/PBI structures. The highly selective functionalization conducted in organic solution on MoS₂ and WSe₂ opens up a pathway to controllable, versatile functionalization of layered materials, which is highly sought after for its potential in passivation, tuning of properties and applications in optics, electronics, and (bio-) sensing.

中文翻译：

---

层状材料的高选择性非共价片上功能化

层状二维材料的非共价功能化是修改和充分利用其光学、电学和化学性质的重要工具。在此，提出了一种简便的方法，可以直接在生长基板（片上）上在过渡金属二硫属化物（TMD）上选择性形成苝双酰亚胺（PBI）的自组装单层（SAM）。横向分辨红外原子力显微镜 (AFM-IR) 和飞行时间二次离子质谱法 (TOF-SIMS) 被用作卓越的技术，以获得超越传统表面分析技术（如拉曼光谱和 AFM）的详细信息。 TMD/PBI 结构。在有机溶液中对 MoS ₂和 WSe ₂进行高选择性功能化 为层状材料的可控、多功能功能化开辟了一条途径，该材料因其在钝化、性能调整和光学、电子和（生物）传感方面的应用方面的潜力而备受追捧。