The effect of toluene, a solvent commonly used in fabricating hole transport layers (HTLs), on poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT:PSS) hole injection layer and its role in reducing the stability of solution-coated organic light-emitting devices (OLEDs) is investigated. In order to isolate and study the effect of solvents on the hole injection layers alone, only the PEDOT:PSS is exposed to the toluene, whereas the other device layers are fabricated by vacuum-deposition. Results show that the solvent exposure leads to a significant decrease in device electroluminescence (EL) stability, revealing that the phenomenon plays a role in the lower stability of devices with solution-coated HTLs. The solvent exposure is found to reduce hole injection efficiency, possibly due to changes at the PEDOT:PSS/HTL interface, a phenomenon that likely plays a role in the lower EL stability. The findings bring to light one of the major root causes of the lower stability of solution-coated OLEDs.

甲苯，一种通常用于制造空穴传输层（HTL）的溶剂，对聚（3,4-乙撑二氧噻吩）-聚（苯乙烯磺酸盐）（PEDOT：PSS）空穴注入层的影响及其在降低溶液稳定性方面的作用-研究了涂覆有机发光器件（OLED）。为了隔离和研究溶剂对空穴注入层的影响，仅PEDOT：PSS暴露于甲苯，而其他器件层则通过真空沉积法制备。结果表明，溶剂暴露导致器件电致发光（EL）稳定性显着降低，表明该现象在具有溶液包被的HTL的器件的较低稳定性中起作用。发现溶剂暴露会降低空穴注入效率，这可能是由于PEDOT：PSS / HTL界面的变化，这种现象可能在较低的EL稳定性中起作用。这些发现揭示了溶液涂覆的OLED稳定性较低的主要原因之一。