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Dual response surface optimization using a process “capability” index
Communications in Statistics - Theory and Methods ( IF 0.8 ) Pub Date : 2021-01-11
Michael Bendersky, Noam Barak, Yisrael Parmet

Abstract

Dual Response Surface Methodology is a powerful tool for simultaneously optimizing the mean and the variance of a quality characteristic in the field of quality engineering. The optimization of dual response systems to achieve better quality has played a major role in the design of industrial products and processes. In this paper we suggest using a process capability index - Cpk - as the objective function. We show by ways of multiple examples that this method improves the obtained yield of a process for different response variable types.



中文翻译:

使用过程“能力”指数的双响应面优化

摘要

双重响应曲面方法学是同时优化质量工程领域中质量特征的均值和方差的强大工具。优化双响应系统以获得更好的质量在工业产品和过程的设计中起着重要作用。在本文中,我们建议使用过程能力指数-Cpk-作为目标函数。我们通过多个示例说明了该方法提高了针对不同响应变量类型的过程的获得的产量。

更新日期:2021-01-11
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