This work focuses on the use of x-ray computed tomography for non-destructive characterization of additively manufactured parts. Ti-6Al-4V parts manufactured using electron beam melting were used. Within this context a comparative study between laboratory and synchrotron-based x-ray computed tomography (LXCT and SXCT) is presented showing the advantages of both techniques. Additionally, the interplay between field-of-view, resolution and sub-sample extraction is systematically presented both qualitatively and quantitatively for LXCT. Overall, it was concluded that laboratory based μXCT offered a compelling alternative to SXCT for static measurements involving defect characterization in AM parts while synchrotron-based techniques offered unmatched performance for dynamic and sub-micron studies.

这项工作的重点是将X射线计算机断层摄影技术用于增材制造零件的非破坏性表征。使用通过电子束熔化制造的Ti-6Al-4V零件。在此背景下，对实验室和基于同步加速器的X射线计算机断层扫描（LXCT和SXCT）进行了比较研究，显示了这两种技术的优势。此外，系统地定性和定量地显示了LXCT的视野，分辨率和子样本提取之间的相互作用。总体而言，得出的结论是，基于实验室的μXCT为静态测量（涉及AM零件中的缺陷表征）提供了SXCT的引人注目的替代品，而基于同步加速器的技术为动态和亚微米研究提供了无与伦比的性能。