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Low-temperature synthesis of conducting boron-doped nanocrystalline silicon oxide thin films as the window layer of solar cells
Current Applied Physics ( IF 2.4 ) Pub Date : 2021-01-06 , DOI: 10.1016/j.cap.2020.12.009
Subhashis Samanta , Debajyoti Das

Low-temperature synthesis of highly transparent conducting B-doped (p-type) nc-SiOX:H films has been pursued by 13.56 MHz plasma-CVD, using a combination of SiH4, CO2 and B2H6, diluted by H2 and He. Higher substrate temperature (TS) encourages nanocrystallization in B-doped nc-SiOX:H network by reducing bonded H-content, while bonded O-content also reduces simultaneously. At optimized TS = 150 °C, p–nc-SiOX:H film having an optical band gap ~1.98 eV, high conductivity ~0.18 S cm−1, has been obtained via dopant-induced escalation of the electrically active carriers at a deposition rate ~5.3 nm/min. The p–nc-SiOX:H film appears as a promising window layer for the top sub-cell of multi-junction silicon solar cells. A single-junction nc-Si:H based p-i-n solar cell of efficiency (η) ~7.14% with a current-density (JSC) ~14.18 mA/cm2, reasonable fill-factor (FF) ~66.2% and open-circuit voltage (VOC) ~0.7606 V has been fabricated, using the optimum p-type nc-SiOX:H as the window layer deposited at TS = 150 °C.



中文翻译:

低温合成导电掺硼纳米氧化硅薄膜作为太阳能电池的窗口层

在13.56 MHz等离子体化学气相沉积中,采用SiH 4,CO 2和B 2 H 6的组合,并通过稀释后,进行了高透明导电B掺杂(p型)nc-SiO X:H薄膜的低温合成。H 2和He。较高的基片温度(T小号)鼓励纳米化在B掺杂的NC-的SiO X通过减少键合的H含量H网络,而键合的O形内容也同时减少。在优化的T S  = 150°C时,p –nc-SiO X:H薄膜的光学带隙为〜1.98 eV,高电导率为〜0.18 S cm -1已经通过掺杂剂诱导的电活性载流子以约5.3 nm / min的沉积速率递增而获得。所述p -NC-的SiO X:H膜显示为用于多结硅太阳能电池的顶部子电池的有前途的窗口层。单结nc-Si:H基pin太阳能电池,效率(η)〜7.14%,电流密度(J SC)〜14.18 mA / cm 2,合理的填充系数(FF)〜66.2%,开路电路电压(V OC)〜0.7606 V具有被制造,使用最优p型NC-的SiO X:H沉积在T窗口层小号 = 150℃。

更新日期:2021-01-14
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