Multicycle tests have several advantages including the ability to support test compaction. By extracting multicycle functional broadside tests from functional test sequences, it is possible to ensure functional operation conditions during the functional capture cycles between the scan operations of a test. The challenge that this article addresses is that the computational effort of extracting $l$ -cycle functional broadside tests from a functional test sequence increases linearly with $l$ . Therefore, the computational effort of a test generation procedure that increases $l$ gradually to match $l$ to the circuit is quadratic in $l$ . This makes it infeasible to consider large values of $l$ that are important for test compaction. To address this challenge the paper develops a partitioning procedure under which test extraction requires the same computational effort for every $l$ . This article also describes a test generation procedure that is linear in $l$ . Experimental results for transition faults in benchmark circuits demonstrate the importance of large values of $l$ for test compaction.

中文翻译：

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将功能测试序列划分为多周期功能宽带测试

多周期测试具有几个优点，包括支持测试压缩的能力。通过从功能测试序列中提取多周期功能宽边测试，可以确保在测试的扫描操作之间的功能捕获周期中确保功能操作条件。本文要解决的挑战是提取的计算量 $ l $ 功能测试序列的周期循环功能侧面测试随 $ l $ 。因此，测试生成过程的计算量会增加 $ l $ 逐渐匹配 $ l $ 到电路是二次方的 $ l $ 。这使得考虑较大的 $ l $ 对于测试压缩非常重要。为了应对这一挑战，本文提出了一种分区程序，在该程序下，测试提取对于每个程序都需要相同的计算量 $ l $ 。本文还介绍了一种线性的测试生成过程 $ l $ 。基准电路中过渡故障的实验结果证明了较大值的重要性。 $ l $ 用于测试压实。